Electron Microscope Specimen Mounts and Holders
Electron Microscopy Sciences Hitachi M4 SEM Cylinder Mount 1-1/4" surface, 1/4" height, Aluminum
Hitachi M4 SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 1-1/4
Pin height: 1/4"
Electron Microscopy Sciences SEM Multi Pin Stub Holder for 12 Hitachi M4
This 62 mm in diameter multi pin holder is designed to save time. It is made from machined aluminum with stainless steel Allen wrench screws. It accommodates up to twelve standard 12.7 mm (1/2") pin stubs
Type: Hitachi M4
Electron Microscopy Sciences Standard Pin SEM Stub 9-Division 25 mm Head with 9 mm Pin, Aluminum, 3.2 mm Pin diameter
9 divisions surface min stub mounts are for use with FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan and Camscan SEMs. Mounts are made from lathe finished ultra-pure aluminum.
Head: 1"
Pin height: 9 mm
Pin diameter: 3.2 mm
Electron Microscopy Sciences Hitachi M4 SEM Cylinder Mount 1-1/4" surface, 1/4" height, Aluminum
Hitachi M4 Thread SEM mounts made from lathe finished ultra-pure aluminum.
Head: 1-1/4"
Height: 1/4"
Electron Microscopy Sciences Hitachi M4 SEM Cylinder Mount 1-1/4" surface, 3/8" height, Aluminum
Hitachi M4 Thread SEM mounts made from lathe finished ultra-pure aluminum.
Head: 1-1/4"
Height: 3/8"
Electron Microscopy Sciences Hitachi M4 SEM Cylinder Mount 1-1/4" surface, 1/4" height, Aluminum
Hitachi M4 SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 1-1/4
Pin height: 1/4"
Electron Microscopy Sciences Hitachi M4 SEM Cylinder Mount 5/8" surface, 3/8" height, Aluminum
Hitachi M4 Thread SEM mounts made from lathe finished ultra-pure aluminum.
Head: 5/8"
Height: 3/8"
Electron Microscopy Sciences SEM Cylinder Mount 45° Angle 5/8" Surface, Aluminum
Scanning electron microscope specimen mount with 45 degree angle. Made from lathe finished ultra-pure aluminum.
Head: 5/8"
Height: 3/8"
Electron Microscopy Sciences Multi Holder for 29 pin Stubs, Hitachi M4
This 90 mm in diameter multi pin holder is designed to save time. It is made from machined aluminum with 302 stainless steel springs that hold the pin stubs in place. It accommodates up to twenty nine standard 12.7 mm (1/2") pin stubs
Type: Hitachi M4
Electron Microscopy Sciences Multi Holder 45 degree for 6 pin stubs, Hitachi M4
This 35 mm in diameter 45 Degree multi pin holder is designed to save time. It allows for a higher SE signal without having to tilt the specimen. It is made from machined aluminum with stainless steel Allen set screws. It accommodates up to six standard 12.7 mm (1/2") pin stubs.
Type: Hitachi M4
Electron Microscopy Sciences Variable Size Geological Thin Section Holder, 9.5mm Pin
This thin section holder is made from vacuum grade aluminum with copper clips and brass screws . The unit measures 51x32x8 mm and holds either standard thin sections of 47 x 27 mm or smaller or larger thin sections. Smallest size would be 40x20 mm. The holder comes complete with 2 clips to insure nothing moves. The holder has convenient tweezer inserts which allow for easy loading.
Type: 9.5mm Pin
Electron Microscopy Sciences Calibration Standard Model 70-1D with Cert Mounted on Steel
A precision pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements. Period: 70 nm pitch, one-dimensional array. Accurate to +/- 0.25 nm. Refer to calibration certificate for actual pitch. Surface: Silicon Oxide ridges on Silicon, 4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. For AFM, use in contact, intermittent contact (TappingMode) and other modes with image sizes from 100 to 3000 nm.
Electron Microscopy Sciences Calibration Specimen 300-2D, Choose a mount
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Array of Posts. Pitch 297. Al bumps on Si. Use contact or TappingMode.
Mount: Choose a mount
Electron Microscopy Sciences Calibration Specimen 700-1D, Steel disk for AFM
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Parallel Ridges Pitch 700, W-coated Photoresist on Si. Use contact or TappingMode.
Mount: AFM
Electron Microscopy Sciences PS 300 XO Calibration Slide
All of the PS-XO series of Calibration Slides are made with Green Float Glass and have a bright Chrome Image High definition 300mm scale in 0.1mm divisions with extended 0.5mm, 1.0mm and 5.0mm lines. Series of dots and crosses, at 10mm intervals.